Electronics and Defects of Oxide Films Grown on Metals - Archive ouverte HAL
Communication Dans Un Congrès Année : 2012

Electronics and Defects of Oxide Films Grown on Metals

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Matériaux
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Dates et versions

hal-00818827 , version 1 (29-04-2013)

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  • HAL Id : hal-00818827 , version 1

Citer

A. Galerie, Y. Wouters, J.P. Petit. Electronics and Defects of Oxide Films Grown on Metals. QMN-3, Quantitative Micro-Nano Approach to Predicting SCC of Fe-Cr-Ni Alloys, Jun 2012, Idaho, United States. ⟨hal-00818827⟩
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