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Article Dans Une Revue X-Ray Spectrometry Année : 2008

High-resolution x-ray analysis with multilayer gratings

Résumé

Periodic multilayers are nowadays widely used to perform x-ray analysis in the soft x-ray range (photon energy lower than 1 keV). However, they do not permit to obtain high-resolution spectra like natural or synthetic crystals. Thus, multilayers cannot resolve interferences between close x-ray lines. It has been shown and demonstrated experimentally that patterning a grating profile within a multilayer structure leads to a diffractive optics with improved resolving power. We illustrate the use of a Mo/B4C multilayer grating in the Fe L and C K spectral ranges, around 700 eV and 280 eV respectively. First, in the Fe L range, the improved spectral resolution enables us to distinguish the Fe Lα and Lβ emissions (separated by 13 eV). In addition, using a sample made of a mix of LiF and an iron ore, we show that it is possible to easily resolve the F K and Fe L emissions. These examples demonstrate that an improved x-ray analysis can be obtained with multilayer gratings when there is the need to study samples having elements giving rise to close emission lines. Second, in the C K range, by comparing C Kα spectra from B4C and cellulose, we show that the shape of the emission band is sensitive to the chemical state of the carbon atom.
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Dates et versions

hal-00808363 , version 1 (05-04-2013)

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Philippe Jonnard, Karine Le Guen, Jean-Michel André. High-resolution x-ray analysis with multilayer gratings. X-Ray Spectrometry, 2008, 38, pp.117-120. ⟨10.1002/xrs.1128⟩. ⟨hal-00808363⟩
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