Resolving dopants in semiconductors by scanning tunneling microscopy - Archive ouverte HAL Access content directly
Conference Papers Year : 2010

Resolving dopants in semiconductors by scanning tunneling microscopy

Maxime Berthe
B. Grandidier
G. Mahieu
  • Function : Author
T. Xu
  • Function : Author
D. Deresmes
J.P. Nys
  • Function : Author
P. Ebert
  • Function : Author
No file

Dates and versions

hal-00808236 , version 1 (05-04-2013)

Identifiers

  • HAL Id : hal-00808236 , version 1

Cite

Maxime Berthe, B. Grandidier, G. Mahieu, T. Xu, D. Deresmes, et al.. Resolving dopants in semiconductors by scanning tunneling microscopy. Journées Thématiques du GdR Nanofils Semiconducteurs - Dopage des nanofils semiconducteurs, 2010, Rouen, France. ⟨hal-00808236⟩
18 View
0 Download

Share

Gmail Facebook X LinkedIn More