Electrical transport measurements and topography of semiconductor nanowires by four probe and low temperature scanning tunneling microscopy - Archive ouverte HAL
Communication Dans Un Congrès Année : 2011
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hal-00807584 , version 1 (04-04-2013)

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  • HAL Id : hal-00807584 , version 1

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Corentin Durand, Maxime Berthe, Thanh Hai Nguyen, Philippe Caroff, Jean-Philippe Nys, et al.. Electrical transport measurements and topography of semiconductor nanowires by four probe and low temperature scanning tunneling microscopy. Herodot Summer School, 2011, Cargese, France. ⟨hal-00807584⟩
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