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Conference Papers Year : 2011

[Invited] On-wafer S-parameters and noise measurements from D to J-band

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hal-00807123 , version 1 (03-04-2013)

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  • HAL Id : hal-00807123 , version 1

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N. Waldhoff. [Invited] On-wafer S-parameters and noise measurements from D to J-band. European Microwave Week, EuMIC/EuMC, Workshop W10 - From de-embedding to waveform engineering, 2011, Manchester, United Kingdom. ⟨hal-00807123⟩
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