Conference Papers
Year : 2011
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https://hal.science/hal-00807123
Submitted on : Wednesday, April 3, 2013-8:20:45 AM
Last modification on : Friday, March 24, 2023-2:52:57 PM
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- HAL Id : hal-00807123 , version 1
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N. Waldhoff. [Invited] On-wafer S-parameters and noise measurements from D to J-band. European Microwave Week, EuMIC/EuMC, Workshop W10 - From de-embedding to waveform engineering, 2011, Manchester, United Kingdom. ⟨hal-00807123⟩
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