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Communication Dans Un Congrès Année : 2005

Parameters Analysis Influencing 3D Measurement without Contact by Laser Scanner to Make a Compensation Model

Résumé

The 3D measurement is more and more important in industrial applications. There are different applications like 3D inspection or reverse engineering. In the both cases, the classical techniques by contact present the advantage of a good accuracy but the costs are expensive because of the slow progress of the measurement. In an other hand, the without contact technologies have a high cadency of points measurement but with a lower accuracy. We present in this study a methodology to estimate the measurement uncertainties and to correct the systematic error. The global error can be separated in random error (in the order of 25 m for the considered laser scanner) and in systematic error (in the same order). To improve the accuracy, we create a compensation model depending of the principal measurement parameters: distance between scanner and measured surface, laser beam incidence angle and projected angle. The global model is derived on the Xi, Liu and Feng's model. We apply it in a case of a calibrated reference sphere and a truncated pyramid in comparing the results with these obtained by contact measurement. A local model principle is given for further applications.
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Dates et versions

hal-00803928 , version 1 (23-03-2013)

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  • HAL Id : hal-00803928 , version 1

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Jean François Fontaine, Jean-Pierre Gonnet, Ahmed Isheil, David Joannic. Parameters Analysis Influencing 3D Measurement without Contact by Laser Scanner to Make a Compensation Model. 9th CAT CIRP seminar, Apr 2005, France. ⟨hal-00803928⟩
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