Conference Papers Year : 2012

Twin-scale Vernier Micro-Pattern for Visual Measurement of 1D in-plane Absolute Displacements with Increased Range-to-Resolution Ratio.

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Micro and nanotechnologies/Microelectronics

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https://hal.science/hal-00802300

Submitted on : Tuesday, March 19, 2013-3:11:07 PM

Last modification on : Monday, December 9, 2024-3:37:06 PM

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hal-00802300 , version 1 (19-03-2013)

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  • HAL Id : hal-00802300 , version 1

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July Galeano Zea, Patrick Sandoz, Guillaume J. Laurent, Lucas Lopes Lemos, Cédric Clévy. Twin-scale Vernier Micro-Pattern for Visual Measurement of 1D in-plane Absolute Displacements with Increased Range-to-Resolution Ratio.. IEEE International Symposium on OptoMechatronic Technologies., Oct 2012, Paris, France. pp.1-7. ⟨hal-00802300⟩

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