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Communication Dans Un Congrès Année : 2011

Extreme Value Analysis, Probabilistic and Statistical Models and their Applications

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hal-00801495 , version 1 (16-03-2013)

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  • HAL Id : hal-00801495 , version 1

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Thomas Opitz, Jean-Noel Bacro, Pierre Ribereau. Extreme Value Analysis, Probabilistic and Statistical Models and their Applications. New inferential tools for max-stable processes, 2011, Lyon, France. ⟨hal-00801495⟩
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