Characterization by laser-ultrasonics of thin film/substrate structure : application to the detection of microcracks

Sabrina Fourez; Frédéric Jenot; Mohammadi Ouaftouh; Marc Duquennoy; Mohamed Ourak

Conference Papers Year : 2012

Characterization by laser-ultrasonics of thin film/substrate structure : application to the detection of microcracks

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Sabrina Fourez

Function : Author
PersonId : 1307661
IdRef : 171525531

Frédéric Jenot

Function : Author
PersonId : 745609
IdHAL : frederic-jenot
IdRef : 077096797

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

Mohammadi Ouaftouh

Function : Author
PersonId : 749862
IdHAL : mohammadi-ouaftouh
ORCID : 0000-0003-0048-3455
IdRef : 120084171

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Marc Duquennoy

Function : Author
PersonId : 750996
IdHAL : marc-duquennoy
ORCID : 0000-0003-1520-5992
IdRef : 162024606

Mohamed Ourak

Function : Author
PersonId : 750950
IdHAL : mohamed-ourak

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Submitted on : Monday, March 11, 2013-9:05:32 AM

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hal-00798860 , version 1 (11-03-2013)

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Sabrina Fourez, Frédéric Jenot, Mohammadi Ouaftouh, Marc Duquennoy, Mohamed Ourak. Characterization by laser-ultrasonics of thin film/substrate structure : application to the detection of microcracks. 6th International Symposium on Signal, Image, Video and Communications, ISIVC 2012, 2012, Valenciennes, France. ⟨hal-00798860⟩

Characterization by laser-ultrasonics of thin film/substrate structure : application to the detection of microcracks

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