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Communication Dans Un Congrès Année : 2012

Probabilistic Design for Reliability (PDfR) and a Novel Approach to Qualification Testing (QT)

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Electronique
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Dates et versions

hal-00797407 , version 1 (06-03-2013)

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  • HAL Id : hal-00797407 , version 1

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Ephraim Suhir, Ravi Mahajan, Alan Lucero, Laurent Bechou. Probabilistic Design for Reliability (PDfR) and a Novel Approach to Qualification Testing (QT). IEEE/AIAA Aerospace Conf., Mar 2012, Big Sky, Montana, United States. pp.3843-3860. ⟨hal-00797407⟩
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