Technical Diagnostics in Electronics: Application of Bayes Formula and Boltzmann-Arrhenius-Zhurkov (BAZ) Model - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Printed Circuit Design& Fab/Circuits Assembly Année : 2012

Technical Diagnostics in Electronics: Application of Bayes Formula and Boltzmann-Arrhenius-Zhurkov (BAZ) Model

Domaines

Electronique
Fichier non déposé

Dates et versions

hal-00797400 , version 1 (06-03-2013)

Identifiants

  • HAL Id : hal-00797400 , version 1

Citer

E. Suhir, L. Bechou, A. Bensoussan. Technical Diagnostics in Electronics: Application of Bayes Formula and Boltzmann-Arrhenius-Zhurkov (BAZ) Model. Printed Circuit Design& Fab/Circuits Assembly, 2012, 29 (12), pp.25-28. ⟨hal-00797400⟩
83 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More