Journal Articles
Advanced Materials Research
Year : 2011
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https://hal.science/hal-00795917
Submitted on : Friday, March 1, 2013-10:27:34 AM
Last modification on : Saturday, October 14, 2023-9:27:18 AM
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- HAL Id : hal-00795917 , version 1
- DOI : 10.4028/www.scientific.net/AMR.324.277
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Pierre Campistron, Julien Carlier, N. Saad, J. Gao, Malika Toubal, et al.. High frequency ultrasound, a tool for elastic properties measurement of thin films fabricated on silicon. Advanced Materials Research, 2011, 324, pp.277-281. ⟨10.4028/www.scientific.net/AMR.324.277⟩. ⟨hal-00795917⟩
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