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Article Dans Une Revue Measurement Science and Technology Année : 2012

Non-contact thickness gauging of a thin film using surface waves and a void effect on their propagation

Sabrina Fourez
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Mohammadi Ouaftouh
Marc Duquennoy
Mohamed Ourak

Dates et versions

hal-00790376 , version 1 (20-02-2013)

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Sabrina Fourez, Frédéric Jenot, Mohammadi Ouaftouh, Marc Duquennoy, Mohamed Ourak. Non-contact thickness gauging of a thin film using surface waves and a void effect on their propagation. Measurement Science and Technology, 2012, 23, pp.085608-1-8. ⟨10.1088/0957-0233/23/8/085608⟩. ⟨hal-00790376⟩
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