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Article Dans Une Revue IEEE Transactions on Device and Materials Reliability Année : 2012

Investigation on statistical tools to analyze repetitive-electrostatic-discharge endurance of system-level protections

Résumé

To fulfill the requirement of final-user uncontrolled ESD environment, system-level ESD protection devices must survive repeated ESD stresses. This paper deals with the assessment of ESD protection device reliability toward repetitive stresses using statistical distribution. The proposed method could lead to better ESD robustness improvement than the simplistic "higher ESD robustness" requirement.
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Dates et versions

hal-00787197 , version 1 (11-02-2013)

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Marianne Diatta, David Trémouilles, Emilien Bouyssou, Marise Bafleur. Investigation on statistical tools to analyze repetitive-electrostatic-discharge endurance of system-level protections. IEEE Transactions on Device and Materials Reliability, 2012, 12 (4), pp.607--614. ⟨10.1109/TDMR.2012.2230093⟩. ⟨hal-00787197⟩
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