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Communication Dans Un Congrès Année : 2013

Thermo-mechanical reliability issues in complex microelectronic assemblies: methodological approach

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hal-00780832 , version 1 (24-01-2013)

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  • HAL Id : hal-00780832 , version 1

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Hélène Fremont. Thermo-mechanical reliability issues in complex microelectronic assemblies: methodological approach. Oregon CPMT/CAS Joint Technical Seminar, Jan 2013, United States. ⟨hal-00780832⟩
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