Combined use of Raman and ToF-SIMS imaging to investigate lead speciation on vegetable leaves exposed to industrial particles - Archive ouverte HAL
Communication Dans Un Congrès Année : 2012

Combined use of Raman and ToF-SIMS imaging to investigate lead speciation on vegetable leaves exposed to industrial particles

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Chimie théorique et/ou physique

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https://hal.science/hal-00779392

Soumis le : mardi 22 janvier 2013-10:49:33

Dernière modification le : mardi 3 décembre 2024-10:22:03

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hal-00779392 , version 1 (22-01-2013)

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  • HAL Id : hal-00779392 , version 1

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Eva Schreck, G. Uzu, M. Moreau, N. Nuns, Camille Dumat, et al.. Combined use of Raman and ToF-SIMS imaging to investigate lead speciation on vegetable leaves exposed to industrial particles. 37th International Symposium on Environmental Analytical Chemistry, May 2012, Antwerp, Belgium. ⟨hal-00779392⟩

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