Electrical characterization and modeling of the amorphous/crystalline silicon interface - Archive ouverte HAL
Conference Papers Year : 2012

Electrical characterization and modeling of the amorphous/crystalline silicon interface

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https://centralesupelec.hal.science/hal-00778999

Submitted on : Monday, January 21, 2013-3:57:52 PM

Last modification on : Tuesday, August 27, 2024-9:36:58 AM

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hal-00778999 , version 1 (21-01-2013)

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  • HAL Id : hal-00778999 , version 1

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Jean-Paul Kleider, Renaud Varache, Wilfried Favre, Olga Maslova, José Alvarez, et al.. Electrical characterization and modeling of the amorphous/crystalline silicon interface. E-MRS 2012 Spring Meeting, May 2012, Strasbourg, France. ⟨hal-00778999⟩

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