Electrical characterization and modeling of the amorphous/crystalline silicon interface - Archive ouverte HAL Access content directly
Conference Papers Year : 2012
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hal-00778999 , version 1 (21-01-2013)

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  • HAL Id : hal-00778999 , version 1

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Jean-Paul Kleider, Renaud Varache, Wilfried Favre, Olga Maslova, José Alvarez, et al.. Electrical characterization and modeling of the amorphous/crystalline silicon interface. E-MRS 2012 Spring Meeting, May 2012, Strasbourg, France. ⟨hal-00778999⟩
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