Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Applied Physics Letters Année : 2012

Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems

Résumé

Synchrotron x-ray nano-tomography was used to characterize the microstructures of multi-layer ceramic capacitors before and after sintering. 3D microstructures of the same sample were reconstructed and quantitatively analyzed. The discontinuities observed in inner electrodes were found to originate from initial heterogeneities of nickel powders in the electrodes. They are supposed to grow due to the constraint of adjacent dielectric layers. Dielectric layers show anisotropic shrinkage with a decrease in density as function of layer position in the multilayer.

Domaines

Matériaux
Fichier non déposé

Dates et versions

hal-00747468 , version 1 (31-10-2012)

Identifiants

Citer

Z.L. Yan, O. Guillon, S. Wang, C.L. Martin, C.S. Lee, et al.. Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems. Applied Physics Letters, 2012, 100 (26), ⟨10.1063/1.4730625⟩. ⟨hal-00747468⟩
68 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More