Three-dimensional high-resolution quantitative microscopy of extended crystals - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Nature Communications Année : 2011

Three-dimensional high-resolution quantitative microscopy of extended crystals

Résumé

Hard X-ray lens-less microscopy raises hopes for a non-invasive quantitative imaging, capable of achieving the extreme resolving power demands of nanoscience. However, a limit imposed by the partial coherence of third generation synchrotron sources restricts the sample size to the micrometer range. Recently, X-ray ptychography has been demonstrated as a solution for arbitrarily extending the fi eld of view without degrading the resolution. Here we show that ptychography, applied in the Bragg geometry, opens new perspectives for crystalline imaging. The spatial dependence of the three-dimensional Bragg peak intensity is mapped and the entire data subsequently inverted with a Bragg-adapted phase retrieval ptychographical algorithm. We report on the image obtained from an extended crystalline sample, nanostructured from a silicon-on-insulator substrate. The possibility to retrieve, without transverse size restriction, the highly resolved three-dimensional density and displacement fi eld will allow for the unprecedented investigation of a wide variety of crystalline materials, ranging from life science to microelectronics.
Fichier principal
Vignette du fichier
Godard_ncomm_2011.pdf (827.24 Ko) Télécharger le fichier
Origine : Fichiers éditeurs autorisés sur une archive ouverte
Loading...

Dates et versions

hal-00738278 , version 1 (26-09-2015)

Identifiants

Citer

Pierre Godard, G. Carbone, Marc Allain, Francesca Mastropietro, G. Chen, et al.. Three-dimensional high-resolution quantitative microscopy of extended crystals. Nature Communications, 2011, 2, pp.568. ⟨10.1038/ncomms1569⟩. ⟨hal-00738278⟩
127 Consultations
128 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More