Interpretation of the two-components observed in high resolution X-ray diffraction omega-scan peaks from mosaic thin films: case of both PLD-grown ZnO on c-sapphire substrate and MBE-grown GaP on silicon substrate - Archive ouverte HAL
Communication Dans Un Congrès Année : 2011

Interpretation of the two-components observed in high resolution X-ray diffraction omega-scan peaks from mosaic thin films: case of both PLD-grown ZnO on c-sapphire substrate and MBE-grown GaP on silicon substrate

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Optique / photonique

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https://hal.science/hal-00726686

Soumis le : vendredi 31 août 2012-09:25:00

Dernière modification le : lundi 16 septembre 2024-17:52:04

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hal-00726686 , version 1 (31-08-2012)

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  • HAL Id : hal-00726686 , version 1

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Olivier Durand, Antoine Létoublon, D. J. Rogers, F. Hosseini Teherani, Charles Cornet, et al.. Interpretation of the two-components observed in high resolution X-ray diffraction omega-scan peaks from mosaic thin films: case of both PLD-grown ZnO on c-sapphire substrate and MBE-grown GaP on silicon substrate. 3rd International Workshop "Current trends and advanced ellipsometric and XRD techniques for the characterization of nanostructured materials", Sep 2011, Bucharest, Romania. ⟨hal-00726686⟩

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