EELS analysis of InxGa1-xAsySb1-y nanostructures - Archive ouverte HAL Access content directly
Conference Papers Year : 2012

EELS analysis of InxGa1-xAsySb1-y nanostructures


This work is focused on the analysis by TEM analytical techniques of InAs-GaAs-Sb nanostructures
Fichier principal
Vignette du fichier
AnaMBeltran_EMC_2012_ref.928_2.pdf (80.56 Ko) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

hal-00720235 , version 1 (24-07-2012)


  • HAL Id : hal-00720235 , version 1


Anna Maria Beltrán, Sanchez Am, Pena F de La, Ben Teresa, Sales David, et al.. EELS analysis of InxGa1-xAsySb1-y nanostructures. 15th European Microscopy Conference, Sep 2012, Manchester, United Kingdom. 2p. ⟨hal-00720235⟩
143 View
98 Download


Gmail Facebook X LinkedIn More