EELS analysis of InxGa1-xAsySb1-y nanostructures - Archive ouverte HAL Access content directly
Conference Papers Year : 2012

EELS analysis of InxGa1-xAsySb1-y nanostructures

Abstract

This work is focused on the analysis by TEM analytical techniques of InAs-GaAs-Sb nanostructures
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Dates and versions

hal-00720235 , version 1 (24-07-2012)

Identifiers

  • HAL Id : hal-00720235 , version 1

Cite

Anna Maria Beltrán, Sanchez Am, Pena F de La, Ben Teresa, Sales David, et al.. EELS analysis of InxGa1-xAsySb1-y nanostructures. 15th European Microscopy Conference, Sep 2012, Manchester, United Kingdom. 2p. ⟨hal-00720235⟩
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