Enhancing accuracy of low-dropout regulator susceptibility extraction with on-chip sensors
Résumé
Presented is a new test method that consists in monitoring on-chip internal voltages during susceptibility tests of integrated circuits. An on-chip sensor was installed at several internal nodes within low dropout regulators to measure the distortion of internal signals induced by the coupling of electromagnetic interference. The comparison between external and internal measurement results shows that on-chip sensor techniques enhance the extraction of circuit susceptibility levels, especially at high frequencies.
Fichier principal
Enhancing_accuracy_of_low-dropout_regulator_susceptibility_extraction_with_on-chip_sensors.pdf (95.84 Ko)
Télécharger le fichier
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|
Loading...