A vacuum double-crystal spectrometer for reference-free highly charged ions X-ray spectroscopy
Résumé
We have built a vacuum double crystal spectrometer, which coupled to an electron-cyclotron resonance ion source, allows to measure low-energy x-ray transitions in highly-charged ions with accuracies of the order of a few parts per million. We describe in detail the instrument and its performances. Furthermore, we present a few spectra of transitions in Ar$^{14+}$ , Ar$^{15+}$ and Ar$^{16+}$. We have developed an \emph{ab initio} simulation code that allows us to obtain accurate line profiles. It can reproduce experimental spectra with unprecedented accuracy. The quality of the profiles allows the direct determination of line width.
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|
Loading...