Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy - Archive ouverte HAL
Journal Articles International Journal of Nanotechnology Year : 2012

Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy

M. Dehlinger
  • Function : Author
C. Dorczynski
  • Function : Author
C. Fauquet
Centre Interdisciplinaire de Nanoscience de Marseille
F. Jandard
Centre Interdisciplinaire de Nanoscience de Marseille
CV
D. Tonneau
Centre Interdisciplinaire de Nanoscience de Marseille
CV
A. Bjeoumikhov
  • Function : Author
S. Bjeoumikhova
  • Function : Author
R. Gubzhokov
  • Function : Author
A. Erko
  • Function : Author
I. Zizak
  • Function : Author
D. Pailharey
  • Function : Author
Centre Interdisciplinaire de Nanoscience de Marseille
S. Ferrero
B. Dahmani
  • Function : Author

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Micro and nanotechnologies/Microelectronics

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https://hal.science/hal-00697528

Submitted on : Tuesday, May 15, 2012-3:39:28 PM

Last modification on : Friday, March 24, 2023-2:52:55 PM

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hal-00697528 , version 1 (15-05-2012)

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M. Dehlinger, C. Dorczynski, C. Fauquet, F. Jandard, D. Tonneau, et al.. Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy. International Journal of Nanotechnology, 2012, 9 (3-7), pp.460-470. ⟨10.1504/IJNT.2012.045348⟩. ⟨hal-00697528⟩

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