Application of the Spark Plasma Sintering Technique to Low-Temperature Copper Bonding - Archive ouverte HAL
Article Dans Une Revue IEEE Transactions on Components and Packaging Technologies Année : 2012

Application of the Spark Plasma Sintering Technique to Low-Temperature Copper Bonding

Bassem Mouawad
  • Fonction : Auteur
Maher Soueidan
  • Fonction : Auteur
D. Fabregue
Cyril Buttay
Hervé Morel
Christian Martin

Résumé

Planar structures, in which a power die is soldered on a substrate and wirebonds are used to connect the top of the die with the substrate, are limited in terms of thermal management and power density. Three-dimensional packaging techniques have been proposed to overcome these limits. Here, an innovative copper-to-copper bonding solution is presented, that can be used for 3-D packaging. The bonding process is described and the effect of the bonding parameters is investigated. It is found that this technique is compatible with the requirements of power electronic packaging. A test assembly including a silicon power die and ceramic substrates is presented.
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Dates et versions

hal-00672244 , version 1 (20-02-2012)

Identifiants

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Bassem Mouawad, Maher Soueidan, D. Fabregue, Cyril Buttay, Bruno Allard, et al.. Application of the Spark Plasma Sintering Technique to Low-Temperature Copper Bonding. IEEE Transactions on Components and Packaging Technologies, 2012, 2 (4), pp.553 - 560. ⟨10.1109/TCPMT.2012.2186453⟩. ⟨hal-00672244⟩
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