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Article Dans Une Revue Microelectronics Reliability Année : 2011

Experimental power cycling on insulated TRIAC package: Reliability interpretation thanks to an innovative failure analysis flow

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hal-00670531 , version 1 (15-02-2012)

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A. Aubert, S. Jacques, S. Pétremont, N. Labat, H. Frémont. Experimental power cycling on insulated TRIAC package: Reliability interpretation thanks to an innovative failure analysis flow. Microelectronics Reliability, 2011, 51 (9-11), pp.1849-1849. ⟨10.1016/j.microrel.2011.07.071⟩. ⟨hal-00670531⟩
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