Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation for IC Characterization and Failure Analysis - Archive ouverte HAL Access content directly
Conference Papers Year : 2009
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hal-00670060 , version 1 (14-02-2012)

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  • HAL Id : hal-00670060 , version 1

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V. Pouget, Emeric Faraud, Kai Shao, S. Jonathas, D. Horain, et al.. Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation for IC Characterization and Failure Analysis. 35th International Symposium for Testing and Failure Analysis (ISTFA), Nov 2009, Sans José, United States. pp.268-271. ⟨hal-00670060⟩
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