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Journal Articles Microelectronics Reliability Year : 2011

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization

Fulvio Infante
  • Function : Author
H.B Kor
  • Function : Author
C. Gan
  • Function : Author

Abstract

Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot-Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to obtain a stable solution, the magnetic data is severely low-pass filtered in the spatial Fourier domain, and some important information is lost. In this paper, the contribution given by the different spatial frequencies was studied: it was demonstrated how this information can be used to obtain additional information regarding the position of the currents. A comparative study between the theoretical approach and the application to the measurements is also shown.

Domains

Electronics

Dates and versions

hal-00669757 , version 1 (13-02-2012)

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Cite

Fulvio Infante, Philippe Perdu, H.B Kor, C. Gan, D. Lewis. Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. Microelectronics Reliability, 2011, 51, pp.1684-1688. ⟨10.1016/j.microrel.2011.07.076,⟩. ⟨hal-00669757⟩
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