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Journal Articles Microelectronics Reliability Year : 2009

Electrical modeling of the effect of beam profile for pulsed laser fault injection

Abstract

This paper presents a detailed simulation-based analysis of the influence of the laser spot shape and size on the parametric and logical transient errors that can be injected into a digital device. The effect of the impact of a Gaussian laser beam is simulated at the electrical level for different pulse durations. Results illustrate the complex interaction between the electrical function and the laser perturbation, with potential implications for secure circuit design.
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Dates and versions

hal-00669736 , version 1 (13-02-2012)

Identifiers

  • HAL Id : hal-00669736 , version 1

Cite

C. Godlewski, V. Pouget, D. Lewis, Mathieu Lisart. Electrical modeling of the effect of beam profile for pulsed laser fault injection. Microelectronics Reliability, 2009, 49, pp.1143-1147. ⟨hal-00669736⟩
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