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Article Dans Une Revue Nanotechnology Année : 2009

Investigation of the carbon nanotube AFM tip contacts: free sliding versus pinned contact

Résumé

Mechanical response of carbon nanotube atomic force microscope probes are investigated using a thermal noise forcing. Thermal noise spectra are able to investigate mechanical behaviors that cannot be studied using classical atomic force microscope modes. Experimental results show that the carbon nanotube contacts can be classified in two categories: the free sliding and pinned cases. The pinned contact case requires the description of the cantilever flexural vibrations with support spring-coupled cantilever boundary conditions. Our experimental results show that carbon nanotubes exhibit different contact behaviors with a surface, and in turn different mechanical responses.

Dates et versions

hal-00669678 , version 1 (13-02-2012)

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Julien Buchoux, Jean-Pierre Aimé, Rodolphe Boisgard, Cattien V Nguyen, Lionel Buchaillot, et al.. Investigation of the carbon nanotube AFM tip contacts: free sliding versus pinned contact. Nanotechnology, 2009, 20 (47), pp.475701 (1-8). ⟨10.1088/0957-4484/20/47/475701⟩. ⟨hal-00669678⟩
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