An On-Chip Sensor for Time Domain Characterization of Electromagnetic Interferences
Résumé
With the growing concerns about susceptibility of integrated circuits to electromagnetic interferences, the need for accurate prediction tools and models to reduce risks of noncompliance becomes critical for circuit designers. However, on-chip characterization of noise is still necessary for model validation. This paper presents an on-chip noise sensor dedicated to the time-domain measurement of voltage fluctuations induced by interference coupling.
Domaines
Electronique| Origine | Fichiers éditeurs autorisés sur une archive ouverte |
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