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Article Dans Une Revue Journal of Applied Crystallography Année : 2011

Combined synchrotron X-rays and image correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

Résumé

Abstract In-situ biaxial tensile tests within the elastic domain were conducted with W/Cu nanocomposite thin films deposited on a polyimide cruciform substrate thanks to a biaxial testing machine developed on the DiffAbs beamline at SOLEIL synchrotron. The mechanical behavior of the nanocomposite was characterized at the micro-scale and the macro-scale using simultaneously synchrotron X-ray diffraction and digital image correlation techniques. Strain analyses for equi-biaxial and non equi-biaxial loading paths have been performed. The results show that the two strain measurements match to within 1 × 10-4 in the elastic domain for strain levels less than 0.3% and for both loading paths.
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Dates et versions

hal-00624445 , version 1 (17-09-2011)

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Soundes Djaziri, Pierre-Olivier Renault, François Hild, Eric Le Bourhis, Philippe Goudeau, et al.. Combined synchrotron X-rays and image correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton. Journal of Applied Crystallography, 2011, 44, pp.1071-1079. ⟨10.1107/S0021889811030226⟩. ⟨hal-00624445⟩
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