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Communication Dans Un Congrès Année : 2011

Security challenges during VLSI test

David Hely
Kurt Rosenfeld
  • Fonction : Auteur
Ramesh Karri
  • Fonction : Auteur

Résumé

VLSI testing is a practical requirement, but unless proper care is taken, features that enhance testability can reduce system security. Data confidentiality and intellectual property protection can be breached through testing security breaches. In this paper we review testing security problems, focusing on the scan technique. We then present some countermeasures which have recently been published and we discuss their characteristics.

Dates et versions

hal-00619524 , version 1 (06-09-2011)

Identifiants

Citer

David Hely, Kurt Rosenfeld, Ramesh Karri. Security challenges during VLSI test. New Circuits and Systems Conference (NEWCAS), 2011 IEEE 9th International, Jun 2011, Bordeaux, France. pp 486 - 489, ⟨10.1109/NEWCAS.2011.5981325⟩. ⟨hal-00619524⟩

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