Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation - Archive ouverte HAL
Communication Dans Un Congrès Année : 2010

Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation

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Matériaux
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Dates et versions

hal-00610638 , version 1 (22-07-2011)

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  • HAL Id : hal-00610638 , version 1

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P. Donnadieu, Y. Shao, G. Botton, S. Lazar, M. Cheynet, et al.. Recent advances in Transmission Electron Microscopy illustrated by an application to atomic scale characterization of nanoscale precipitation. PTM2010 - International Conference on Solid-Solid Phase Transformations, 2010, AVIGNON, France. ⟨hal-00610638⟩
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