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Article Dans Une Revue Measurement Science and Technology Année : 2010

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Résumé

This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and discussed with regard to the respective trade-offs associated with practical off-chip methodologies as well as on-chip measurement scenarios. Strategies are defined to extract the center frequency and 1 dB compression point of a narrow-band LNA operating around 1 GHz. The proposed techniques are experimentally demonstrated using a compact and efficient on-chip temperature sensor for built-in test purposes that has a power consumption of 15 μW and a layout area of 0.005 mm2 in a 0.25 μm CMOS technology. Validating results from off-chip interferometer-based temperature measurements and conventional electrical characterization results are compared with the on-chip measurements, showing the capability of the techniques to estimate the center frequency and 1 dB compression point of the LNA with errors of approximately 6% and 0.5 dB, respectively.

Dates et versions

hal-00609286 , version 1 (18-07-2011)

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Eduardo Aldrete-Vidrio, Diego Mateo, Josep Altet, M. Amine Salhi, Stéphane Grauby, et al.. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements. Measurement Science and Technology, 2010, 21 (7), pp.075104 (10). ⟨10.1088/0957-0233/21/7/075104⟩. ⟨hal-00609286⟩

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