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Conference Papers Year : 2010

Frequency and Time Domain Characterization of Substrate Coupling Effects in 3D Integration Stack

E. Eid
  • Function : Author
T. Lacrevaz
C. Bermond
J. Roullard
  • Function : Author
B. Fléchet
L. Cadix
  • Function : Author
F. Calmon
O. Valorge
  • Function : Author
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Dates and versions

hal-00604338 , version 1 (28-06-2011)

Identifiers

  • HAL Id : hal-00604338 , version 1

Cite

E. Eid, T. Lacrevaz, C. Bermond, S. Capraro, J. Roullard, et al.. Frequency and Time Domain Characterization of Substrate Coupling Effects in 3D Integration Stack. IEEE Int. Electronics Manufacturing Technology Conf.,, Dec 2010, Melaka, Malaysia. ⟨hal-00604338⟩
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