Characterization of Thin MgO Films on Ag(001) by Low-Energy Electron Diffraction and Scanning Tunneling Microscopy - Archive ouverte HAL Access content directly
Journal Articles Journal of Physical Chemistry C Year : 2011

Characterization of Thin MgO Films on Ag(001) by Low-Energy Electron Diffraction and Scanning Tunneling Microscopy

A. Ouvrard
  • Function : Author
J. Niebauer
  • Function : Author
A. Ghalgaoui
  • Function : Author
C. Barth
Centre Interdisciplinaire de Nanoscience de Marseille
CV
C.R. Henry
  • Function : Author
Centre Interdisciplinaire de Nanoscience de Marseille
B. Bourguignon
  • Function : Author

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https://hal.science/hal-00603266

Submitted on : Friday, June 24, 2011-3:17:26 PM

Last modification on : Friday, March 24, 2023-2:52:54 PM

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hal-00603266 , version 1 (24-06-2011)

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  • HAL Id : hal-00603266 , version 1

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A. Ouvrard, J. Niebauer, A. Ghalgaoui, C. Barth, C.R. Henry, et al.. Characterization of Thin MgO Films on Ag(001) by Low-Energy Electron Diffraction and Scanning Tunneling Microscopy. Journal of Physical Chemistry C, 2011, 115 (16), pp.8034-8041. ⟨hal-00603266⟩

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