Detailed product analysis during the low temperature oxidation of n-butane - Archive ouverte HAL
Article Dans Une Revue Physical Chemistry Chemical Physics Année : 2011

Detailed product analysis during the low temperature oxidation of n-butane

Résumé

The products obtained from the low-temperature oxidation of n-butane in a jet-stirred reactor (JSR) have been analysed using two methods: gas chromatography analysis of the outlet gas and reflectron time-of-flight mass spectrometry. The mass spectrometer was combined with tunable synchrotron vacuum ultraviolet photoionization and coupled with a JSR via a molecular-beam sampling system. Experiments were performed under quasi-atmospheric pressure, for temperatures between 550 and 800 K, at a mean residence time of 6 s and with a stoichiometric n-butane/oxygen/argon mixture (composition = 4/26/70 in mol%). 36 reaction products have been quantified, including in addition to the usual oxidation products, acetic acid, hydrogen peroxide, C1, C2 and C4 alkylhydroperoxides and C4 ketohydroperoxides. Evidence of the possible formation of products (dihydrofuranes, furanones) derived from cyclic ethers has also been found. The performance of a detailed kinetic model of the literature has been assessed with the simulation of the formation of this extended range of species. These simulations have also allowed the analysis of possible pathways for the formation of some obtained products.
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Dates et versions

hal-00602156 , version 1 (09-07-2013)

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Olivier Herbinet, Frédérique Battin-Leclerc, Sarah Bax, Hervé Le Gall, Pierre Alexandre Glaude, et al.. Detailed product analysis during the low temperature oxidation of n-butane. Physical Chemistry Chemical Physics, 2011, 13, pp. 296-308. ⟨10.1039/C0CP00539H⟩. ⟨hal-00602156⟩
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