Abstract: We report on the recording performances and signal-to-noise ratio analyses of perpendicular magnetic bit-patterned media. Two different types of magnetic samples are investigated. They differ by the way that they were patterned (nano-imprint versus e-beam lithography) as well as their magnetic properties (Co/Pt multilayers and CoCrPt alloy are the recording layers). By using a contact read/write quasi-static tester, we were able to characterize the write windows, the bit error rates, and measure the signal-to-noise ratio. The influence of magnetic properties and media microstructure on the writing processes is studied. We show also that the lithographical method used to replicate the media induces more or less noise due to structural distributions.