Impact of the ferroelectric film thickness on the performances of a tunable stub resonator in X-band - Archive ouverte HAL
Communication Dans Un Congrès Année : 2011

Impact of the ferroelectric film thickness on the performances of a tunable stub resonator in X-band

Gérard Tanné

Domaines

Matériaux
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Dates et versions

hal-00596652 , version 1 (28-05-2011)

Identifiants

  • HAL Id : hal-00596652 , version 1

Citer

Yonathan Corredores, Quentin Simon, Arnaud Le Febvrier, Lingyan Zhang, Xavier Castel, et al.. Impact of the ferroelectric film thickness on the performances of a tunable stub resonator in X-band. 1er Workshop NIMS - Université de Rennes 1 ''Materials and Sustainable development : Issues and Challenges of the 21st century'', May 2011, Rennes, France. ⟨hal-00596652⟩
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