Characterization of KTa0.5Nb0.5O3 ferroelectric thin films at microwaves and their application to highly-tunable resonators - Archive ouverte HAL
Communication Dans Un Congrès Année : 2011

Characterization of KTa0.5Nb0.5O3 ferroelectric thin films at microwaves and their application to highly-tunable resonators

Gérard Tanné
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hal-00596648 , version 1 (28-05-2011)

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  • HAL Id : hal-00596648 , version 1

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Yonathan Corredores, Quentin Simon, Arnaud Le Febvrier, Lingyan Zhang, Xavier Castel, et al.. Characterization of KTa0.5Nb0.5O3 ferroelectric thin films at microwaves and their application to highly-tunable resonators. E-MRS 2011 Spring Meeting "European Material Research Society", May 2011, Nice, France. ⟨hal-00596648⟩
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