Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package - Archive ouverte HAL Access content directly
Conference Papers Year : 2009

Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package

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hal-00585654 , version 1 (13-04-2011)

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  • HAL Id : hal-00585654 , version 1

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F. Infante, Philippe Perdu, Dean Lewis. Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package. 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Oct 2009, Arcachon, France. pp.1. ⟨hal-00585654⟩
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