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Communication Dans Un Congrès Année : 2011

Link between low frequency noise and reliability of compound semiconductor HEMTs and HBTs

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Electronique
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hal-00585593 , version 1 (13-04-2011)

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  • HAL Id : hal-00585593 , version 1

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Nathalie Labat, Nathalie Malbert, Cristell Maneux, Arnaud Curutchet, Brice Grandchamp. Link between low frequency noise and reliability of compound semiconductor HEMTs and HBTs. INCF 2011, Jun 2011, Toronto, Canada. pp.458-463. ⟨hal-00585593⟩
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