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Communication Dans Un Congrès Année : 2010

Electromechanical Characterization of "Flying" Planar Gate Punch Through IGBT Bare Die

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hal-00585061 , version 1 (11-04-2011)

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  • HAL Id : hal-00585061 , version 1

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Yassine Belmehdi, Stephane Azzopardi, Florence Capy, Jean-Yves Delétage, Eric Woirgard. Electromechanical Characterization of "Flying" Planar Gate Punch Through IGBT Bare Die. 2nd IEEE Energy Conversion Congress and Exposition, Sep 2010, Atlanta, United States. ⟨hal-00585061⟩
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