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Article Dans Une Revue Physical Review B: Condensed Matter and Materials Physics (1998-2015) Année : 2010

Dependence of Curie temperature on the thickness of an ultrathin ferroelectric film

Résumé

The thickness dependency of the Curie temperature in stress-free Pb Zr0.5Ti0.5 O3 ultrathin films under open-circuit conditions is revealed from the computation of some nontrivial statistical quantities such as fourth-order cumulants , via a first-principles-based technique. For thicknesses above 16 Å, this dependency follows the usual finite-size scaling law with a critical exponent that is consistent with the one associated with the three-dimensional-random-Ising universality class. On the other hand, the Curie temperature-versus-film's thickness curve deviates from this scaling law below 12 Å while being rather well described by an empirical equation down to 8 Å.
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Dates et versions

hal-00580765 , version 1 (29-03-2011)

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Emad Almahmoud, I. Kornev, L. Bellaiche. Dependence of Curie temperature on the thickness of an ultrathin ferroelectric film. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 81, pp.064105. ⟨10.1103/PhysRevB.81.064105⟩. ⟨hal-00580765⟩
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