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Article Dans Une Revue Review of Scientific Instruments Année : 2011

Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy

Résumé

The measurement of local surface potentials by Kelvin force microscopy (KFM) can be sensitive to external perturbations which lead to artifacts such as strong dependences of experimental results (typically in a ∼1 V range) with KFM internal parameters (cantilever excitation frequency and/or the projection phase of the KFM feedback-loop). We analyze and demonstrate a correction of such effects on a KFM implementation in ambient air. Artifact-free KFM measurements, i.e., truly quantitative surface potential measurements, are obtained with a ∼30 mV accuracy.

Dates et versions

hal-00579085 , version 1 (23-03-2011)

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Citer

Thierry Melin, Sophie Barbet, Heinrich Diesinger, Didier Theron, D. Deresmes. Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy. Review of Scientific Instruments, 2011, 82, pp.036101-1-3. ⟨10.1063/1.3516046⟩. ⟨hal-00579085⟩
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