Conference Papers
Year : 2009
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https://hal.science/hal-00575300
Submitted on : Thursday, March 10, 2011-9:32:19 AM
Last modification on : Friday, March 24, 2023-2:52:54 PM
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- HAL Id : hal-00575300 , version 1
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A. Gokarna, A. Stolz, El Hadj Dogheche, Didier Decoster, J. Teng, et al.. Complete optical characterization of multilayered InxGa1-xN/GaN structures grown by MOCVD on sapphire substrates. 5th International Conference for Materials Advanced Technologies, ICMAT 2009, Symposium O: Compound Semiconductor Photonics: Materials, Devices and Integration, 2009, _, France. ⟨hal-00575300⟩
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