Si nano wire characterizations in GHz range using in-situ high impedance measurement set-up

L. Nougaret; M. Marczak; D. Hourlier-Bahloul; Vincent Derycke; H. Happy; Gilles Dambrine

Conference Papers Year : 2009

Si nano wire characterizations in GHz range using in-situ high impedance measurement set-up

, , , , , (1)

1

L. Nougaret

Function : Author

M. Marczak

Function : Author

D. Hourlier-Bahloul

Function : Author
PersonId : 180343
IdHAL : djamila-hourlier
ORCID : 0000-0002-4044-4429
IdRef : 074545507

Vincent Derycke

Function : Author
PersonId : 782234
ORCID : 0000-0002-3272-9694
IdRef : 130987271

H. Happy

Function : Author
PersonId : 748086
IdHAL : henri-happy
ORCID : 0000-0003-2065-8080
IdRef : 103891455

Gilles Dambrine

Function : Author
PersonId : 748125
IdHAL : gilles-dambrine

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

Collection IEMN : Connect in order to contact the contributor

https://hal.science/hal-00574842

Submitted on : Wednesday, March 9, 2011-8:12:24 AM

Last modification on : Wednesday, January 24, 2024-9:54:18 AM

Dates and versions

hal-00574842 , version 1 (09-03-2011)

Identifiers

HAL Id : hal-00574842 , version 1

Cite

L. Nougaret, M. Marczak, D. Hourlier-Bahloul, Vincent Derycke, H. Happy, et al.. Si nano wire characterizations in GHz range using in-situ high impedance measurement set-up. Indo-French Workshop on Nanosciences and Nanotechnology, 2009, Delhi, India. ⟨hal-00574842⟩

Si nano wire characterizations in GHz range using in-situ high impedance measurement set-up

Dates and versions

Identifiers

Cite

Export

Collections

Share