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Conference Papers Year : 2010

Amorphous silicon regrowth mechanisms, orientation effects and defects generation : insight from molecular dynamics simulation

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hal-00574101 , version 1 (07-03-2011)

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  • HAL Id : hal-00574101 , version 1

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Christophe Krzeminski, E. Lampin. Amorphous silicon regrowth mechanisms, orientation effects and defects generation : insight from molecular dynamics simulation. European Materials Research Society Spring Meeting, E-MRS Spring 2010, Symposium I : Advanced silicon materials research for electronic and photovoltaic applications II, 2010, Strasbourg, France. ⟨hal-00574101⟩
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