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Article Dans Une Revue Microelectronics Reliability Année : 2010

Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies

Résumé

The use of deeper-submicron technologies in integrated circuits worsens the effects of transient faults. In fact, the transient-fault durations become as important as the clock periods of synchronous circuits. Electronic systems are thus more vulnerable to failure situations. Nevertheless, this paper shows innovatively that such a worse scenario does not happen in asynchronous circuits. This additional novel benefit pushes on the asynchronous design as a better alternative to mitigate transient faults in deep-submicron technology-based circuits.

Dates et versions

hal-00569838 , version 1 (25-02-2011)

Identifiants

Citer

Rodrigo Possamai Bastos, G. Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis. Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies. Microelectronics Reliability, 2010, 50 (9-11), pp.1241-1246. ⟨10.1016/j.microrel.2010.07.014⟩. ⟨hal-00569838⟩

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